Background: Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. With AFM, it is possible to measure a roughness of a sample surface at a high resolution, to distinguish a sample based on its mechanical properties (for example, hardness and roughness) and, in addition, to perform a microfabrication of a sample. Lecture
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CategoriesH.T. CaoGod helps those who help themselves. Archives
January 2020
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