Great thanks to Dr. Václav Ocelík to train us to use another advanced materials characterisation technology: Electron backscatter diffraction (EBSD) or orientation image microscopy (OIM). Learning new things make me happy! EBSD is a microstructural-crystallographic characterisation technique to study any crystalline or polycrystalline material. The technique involves understanding the structure, crystal orientation and phase of materials in the Scanning Electron Microscope (SEM). Typically it is used to explore microstructures, revealing texture, defects, grain morphology and deformation. It can be combined with complementary techniques within the SEM for phase discrimination.
Further information: 1 EBSD_EDAX; 2 EBSD_Oxford; 3 EBSD-Wikipedia
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CategoriesH.T. CaoGod helps those who help themselves. Archives
January 2020
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